Equipment

Shared use equipment and charge

In the project, seven TEMs (or STEMs), one SEM, and some sample preparation facilities are available for shared use.

( revised on November 1, 2018. )

Shared use equipment Charge per 1 time frame (4 hours)
Equipment use Technical support
1300 kVHigh Voltage Electron Microscope (JEM-1300NEF)
 equipped with omega-type EELS
¥17,000

¥4,000


 When needing
 technical support,
 this charge is
 added.
30-200 kV Atomic resolution analytical electron microscope
(JEM-ARM200CF)

 equipped with cold-FEG gun, double Cs correctors, EELS and double wide
 angle XEDS
¥16,000
Cs corrected atomic resolution electron microscope (JEM-ARM200F)
 equipped with double Cs correctors, EELS and a wide angle XEDS
¥17,000
Cs corrected atomic resolution electron microscope (JEM-ARM200F)
 equipped with a Cs corrector for probe form lens, a wide angle XEDS and HRP
*Chikushi campus
¥16,000
300 kV analytical electron microscope (JEM-3200FSK)
 equipped with omega-type EELS and XEDS
¥14,000
Analytical Lorentz electron microscope (TECNAI G2-F20)
 equipped with Lorentz microscopy function and XEDS
*Chikushi campus
¥11,000
Versatile analytical electron microscope (TECNAI 20)
(Zeiss-ULTRA55 + SII-TES)
equipped with SDD-XEDS and EBSD
¥9,400
High resolution SEM with TES high energy resolution EDS
 equipped with XEDS
¥8,300
+Liquid helium cost
Sample preparation facilities
 ・FIB:Focused Ga ion beam milling with SEM (FEI Quanta 3D 200i)
 ・Ar ion beam milling (Gatan PIPSⅡ M 695)
 ・Ar ion beam milling TEM-Mill/Nano-Mill (Fischione M 1050/1040)
FIB: ¥14,000

Main high-performance equipment

Accounting system

 Researchers bear the costs for using the equipment. Charge of each equipment usage is shown in the right column of the above table. The charge is the same rate as users of Kyushu University. The unit charge rate is based on a 4-hour block.